This state-of-the-art imaging facility for both academic and non-academic research features an environmental scanning electron microscope (ESEM) with X-ray microanalysis and a new cold stage that together enable high-resolution imaging of hydrated specimens, observation of dynamic experiments such as crystal formation and dehydration, freeze-fracturing, and ultra-low temperature imaging. Applications range from microelectronics to forensic science. Please see the rest of this website for image examples and equipment and lab details.
The MEIAF is open by appointment. Contact meiaf@bren.ucsb.edu with requests and questions.
The core technology is an FEI Co. XL30 ESEM with a field emission gun (FEG). The ESEM detectors include a patented gaseous secondary electron detector (GSED), a solid-state backscattered electron detector (BSED), a large field detector (LFD), and a STEM detector for scanning transmission microscopy of embedded thin sections.