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Microscopy and Microanalysis Facility

Managed by the Materials Department and open to all members of the university and surrounding community, this facility houses state-of-the-art equipment for materials characterization. 
 
Instruments include 2 transmission electron microscopes (TEMs), 2 focused ion beam microscopes, 3 field-emission scanning electron microscopes (SEMs), 2 atomic force microscopes (AFMs), an atom probe field ion microscope and dedicated X-ray photoelectron spectrometer (XPS) and dynamic secondary ion mass spectrometer (DSIMS) systems. Advanced sample preparation and computational resources ensure excellent sample quality and high-end data analysis.
Access Procedure: 

Training and Lab Access

Instruments

  1. Asylum MFP-3D Bio

    The AFM is mounted on an inverted optical microscope (Olympus IX71) and is equipped with a closed fluid cell for liquid AFM studies.

  2. Asylum MFP-3D Standard System with Low Force Indenter

    Contact and tapping (AC) mode; lateral force mode (LFM); phase imaging; electric force microscopy (EFM); nanolithography; force curve mode; ramp mode; force mapping mode.

  3. FEI Helios Dual-beam 600 FIB/SEM

    A high-resolution dual-beam focused ion beam and scanning electron microscope.

  4. FEI Nova Nano 650 SEM

    High-resolution scanning electron microscope equipped with a high stability Schottky field emission gun and a large specimen chamber.

  5. Secondary Ion Mass Spectrometry (SIMS)

    SIMS is the most sensitive surface analytical technique, with detection limits of parts per billion in favorable cases.

  6. Thermo Scientific Apreo C LoVac SEM

    High-resolution scanning electron microscope equipped with a high stability Schottky field emission gun and a large specimen chamber.

  7. Thermo Scientific Apreo S SEM

    High-resolution scanning electron microscope equipped with a high-stability Schottky field emission gun and a large specimen chamber and compound electrostatic/electromagnetic immersion lenses.

  8. Thermo Scientific Spectra 200

    This instrument is a probe aberration corrected (S-CORR) S/TEM equipped with a cold field emission gun (X-CFEG).

  9. Thermo Scientific Talos F200X

    This instrument is a scanning transmission electron microscope equipped with a high brightness and high electron beam current XFEG field emission gun and a symmetrically arranged quadrant XEDS detector system delivering high resolution and high throughput 2D/3D S/TEM imaging and chemical mapping.

  10. Tri-Beam Laser/FIB/SEM

    Dual-beam focused ion beam and scanning electron microscope equipped with a femtosecond laser and associated scanning and focusing optics.

  11. X-Ray Photoelectron Spectroscopy (XPS)

    XPS is a non-destructive, surface-sensitive spectroscopic technique that measures elemental composition at the parts per thousand range.