Scanning Electron Microscope - JOEL JSM-6300V tungsten/LaB6
Make / Model :
JOEL JSM-6300 Tungsten/LaB6
JEOL JSM-6300V tungsten/LaB6 source SEM, with secondary electron, backscattered electron, and cathodoluminescence imaging capabilities. Fitted with a Tracor X-ray energy spectrometer. A fully equipped sample preparation facility is also available.
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