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Scanning Electron Microscope (FEG-ESEM with EBSD, EDS and CL)

Make / Model : 
FEi Quantra 400F

FEI Quanta 400F field emission source (FEG) SEM. Secondary electron (SE) and backscattered electron (BSE) imaging in high vacuum, low vacuum and environmental imaging modes. The SEM is equipped with an HKL Technology Nordlys 2 electron-backscatter diffraction (EBSD) camera for crystal orientation determination, an INCAx-act silicon drift detector x-ray energy spectrometer (EDS), and a cathodoluminescence (CL) detector.

Technical Primary Contact:
Gareth Seward