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Micro-Environmental Imaging and Analysis Facility (MEIAF)

This state-of-the-art imaging facility for both academic and non-academic research features an environmental scanning electron microscope (ESEM) with X-ray microanalysis and a new cold stage that together enable high-resolution imaging of hydrated specimens, observation of dynamic experiments such as crystal formation and dehydration, freeze-fracturing, and ultra-low temperature imaging. Applications range from microelectronics to forensic science. Please see the rest of this website for image examples and equipment and lab details.

Access Procedure: 

The MEIAF is open by appointment. Contact with requests and questions.


  1. FEI Co. XL30 ESEM-FEG

    The core technology is an FEI Co. XL30 ESEM with a field emission gun (FEG). The ESEM detectors include a patented gaseous secondary electron detector (GSED), a solid-state backscattered electron detector (BSED), a large field detector (LFD), and a STEM detector for scanning transmission microscopy of embedded thin sections.