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Asylum MFP-3D Standard System with Low Force Indenter

Instrument types

Operation Modes:
Contact and tapping (AC) mode; lateral force mode (LFM); phase imaging; electric force microscopy (EFM); nanolithography; force curve mode; ramp mode; force mapping mode.

Features:
90 micron travel in (x, y) and 15 micron in z; X-Y closed loop (non-linearity <0.5 %) with sensitivity < 150 pm noise; Z-closed loop (<0.2 %) with sensitivity < 35 pm noise; ARgyle-3D imaging in real time; AFM control program integrated with IGOR pro.

Technical Primary Contact:
Ravit Silverstein

Access Procedure: